Capacitive impedance measurement : dual-frequency approach.

Simple item page
dc.contributor.authorRêgo Segundo, Alan Kardek
dc.contributor.authorPinto, Érica Silva
dc.contributor.authorSantos, Gabriel Almeida
dc.contributor.authorMonteiro, Paulo Marcos de Barros
dc.date.accessioned2022-01-21T19:16:12Z
dc.date.available2022-01-21T19:16:12Z
dc.date.issued2019pt_BR
dc.description.abstractThe most widely used technique for measuring capacitive impedances (or complex electrical permittivity) is to apply a frequency signal to the sensor and measure the amplitude and phase of the output signal. The technique, although efficient, involves high-speed circuits for phase measurement, especially when the medium under test has high conductivity. This paper presents a sensor to measure complex electrical permittivity based on an alternative approach to amplitude and phase measurement: The application of two distinct frequencies using a current-to-voltage converter circuit based in a transimpedance amplifier, and an 8-bit microcontroller. Since there is no need for phase measurement and the applied frequency is lower compared to the standard method, the circuit presents less complexity and cost than the traditional technique. The main advance presented in this work is the use of mathematical modeling of the frequency response of the circuit to make it possible for measuring the dielectric constant using a lower frequency than the higher cut-off frequency of the system, even when the medium under test has high conductivity (tested up to 1220 µS/cm). The proposed system caused a maximum error of 0.6% for the measurement of electrical conductivity and 2% for the relative dielectric constant, considering measurement ranges from 0 to 1220 µS/cm and from 1 to 80, respectively.pt_BR
dc.identifier.citationRÊGO SEGUNDO, A. K. et al. Capacitive impedance measurement: dual-frequency approach. Sensors 2019, 19, 2539. SENSORS, v. 21, artigo 2149, abr./jun. 2019. Disponível em: <https://www.mdpi.com/1424-8220/19/11/2539>. Acesso em: 12 set. 2021.pt_BR
dc.identifier.doihttps://doi.org/10.3390/s19112539pt_BR
dc.identifier.issn1424-8220
dc.identifier.urihttp://www.repositorio.ufop.br/jspui/handle/123456789/14368
dc.language.isoen_USpt_BR
dc.rightsabertopt_BR
dc.rights.licenseThis article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Fonte: o PDF do artigo.pt_BR
dc.subjectDielectric constantpt_BR
dc.subjectElectrical conductivitypt_BR
dc.subjectInstrumentationpt_BR
dc.subjectMicrocontrollerpt_BR
dc.subjectEmbedded systempt_BR
dc.titleCapacitive impedance measurement : dual-frequency approach.pt_BR
dc.typeArtigo publicado em periodicopt_BR
Files
Original bundle
Now showing 1 - 2 of 2
No Thumbnail Available
Name:
ARTIGO_CapacitiveImpedanceMeasurement.pdf
Size:
3.37 MB
Format:
Adobe Portable Document Format
Description:
Download
No Thumbnail Available
Name:
ERRATUM_CapacitiveImpedanceMeasurement.pdf
Size:
209.75 KB
Format:
Adobe Portable Document Format
Description:
Download
License bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed upon to submission
Description:
Download
Collections
DECAT - Artigos publicados em periódicos