Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities.
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Date
2020
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Abstract
Titanium dioxide substrates have been synthesized by means of solid-state reactions with
sintering temperatures varying from 1150 ◦C up to 1350 ◦C. X-ray diffraction and scanning electron
microscopy (SEM) where employed to investigate the crystal structure, grain size and porosity of
the resulting samples. The obtained ceramics are tetragonal (rutile phase) with average grain sizes
varying from 2.94 µm up to 5.81 µm. The average grain size of samples increases with increasing
temperature, while the porosity decreases. The effect of microstructure on the dielectric properties
has been also studied. The reduction of porosity of samples significantly improves the dielectric
parameters (relative dielectric permittivity and loss tangent) in comparison to those of commercial
substrates, indicating that the obtained ceramic substrates could be useful in the miniaturization of
telecommunication devices.
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Keywords
Permittivity, Solid state sintering, Porosity
Citation
FREITAS, A. E. de et al. Development and characterization of titanium dioxide ceramic substrates with high dielectric permittivities. Materials, v. 13, n. 2, p. 386, 2020. Disponível em: <https://www.mdpi.com/1996-1944/13/2/386>. Acesso em: 10 mar. 2020.