Gypsum : an environment-friendly, inexpensive and robust height calibration standard at nanometer-scale for atomic force microscopy.
No Thumbnail Available
Date
2019
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
Gypsum is an Earth-abundant mineral with enormous applications in agriculture and civil engineering. Here, we show it is also an excellent height calibration standard alternative for atomic force microscopy (AFM). Using plain water as etchant, gypsum flakes readily review 0.75 nm tall terraces which are easy to image (lateral dimensions from tens to hundreds of nanometers) and robust against time in ambient conditions. Therefore, the present work demonstrates a new height standard alternative which is easily-available for all AFM microscopists around the world.
Description
Keywords
Citation
BARBOZA, A. P. M. et al. Gypsum: an environment-friendly, inexpensive and robust height calibration standard at nanometer-scale for atomic force microscopy. Nanotechnology, v. 30, dez. 2019. Disponível em: <https://iopscience.iop.org/article/10.1088/1361-6528/ab5ded>. Acesso em: 03 jul. 2020.