Electrical characterization of in situ polymerized polyaniline thin films.

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dc.contributor.authorTravain, Silmar Antonio
dc.contributor.authorFerreira, Guilherme Fontes Leal
dc.contributor.authorGiacometti, José Alberto
dc.contributor.authorBianchi, Rodrigo Fernando
dc.date.accessioned2015-02-25T16:16:34Z
dc.date.available2015-02-25T16:16:34Z
dc.date.issued2007
dc.description.abstractThe alternating conductivity, σ*(f) = σ (f) + iσ(f), of in situ polymerized polyaniline thin films doped with hydrochloric acid, deposited on top of an interdigitated gold line array previously deposited on glass substrates, were measured in the frequency (f) range between 0.1 Hz to 10 MHz and in the temperature range from 100 to 430 K. The results for σ (f) are typical of a disordered solid material: for frequencies lower than a certain hopping frequency γhop, log[σ (f)] is frequency-independent rising almost linearly for in log f > γhop. A master curve was thus obtained by plotting the real component of the conductivity using normalized scales σ (f)/σdc and f/γhop, which is indicative of a single process operating in the whole frequency range. An expression encompassing the conduction through a disordered structure taken from previous random free energy barrier model for hopping carriers, as well a dielectric function to represent the capacitive behavior of the PAni was employed to fit the experimental results. The dielectric constant and activation energy for hopping carriers were obtained as function of the polymer doping level.pt_BR
dc.identifier.citationTRAVAIN, S. A. et al. Electrical characterization of in situ polymerized polyaniline thin films. Materials Science and Engineering. B, Solid State Materials for Advanced Technology, v. 143, p. 31-37, 2007. Disponível em: <https://www.sciencedirect.com/science/article/pii/S0921510707003935>. Acesso em: 23 fev. 2015.pt_BR
dc.identifier.doihttps://doi.org/10.1016/j.mseb.2007.07.071
dc.identifier.issn0921-5107
dc.identifier.urihttp://www.repositorio.ufop.br/handle/123456789/4493
dc.language.isoen_USpt_BR
dc.rights.licenseO periódico Materials Science and Engineering. B concede permissão para depósito do artigo no Repositório Institucional da UFOP. Número da licença: 3565381195952.pt_BR
dc.subjectPolyanilinept_BR
dc.subjectIn situ polymerizationpt_BR
dc.subjectElectrical propertiespt_BR
dc.subjectImpedance spectroscopypt_BR
dc.titleElectrical characterization of in situ polymerized polyaniline thin films.pt_BR
dc.typeArtigo publicado em periodicopt_BR
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